FT-IR spectroscopy combined with reflectance analysis can
provide information on chemical structure and molecular orientation
of monolayers and other thin films on conductive metal surfaces.
As originally developed, such “Infra-red reflectance-absorbance
spectroscopy” (IRRAS) analysis can be compromised by
poor sensitivity, weak discrimination against bulk absorption
effects, experimental drift, the complexity of reference sample
compensation, atmospheric interference, and slow measurement